Single frequency vertical piezoresponse force microscopy

Vector piezoresponse force microscopy.

A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties-vector piezoresponse force microscopy (Vector PFM)-is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed...

Electrostatic-free piezoresponse force microscopy

Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...

Piezoresponse force microscopy and recent

A Piezoresponse Force Microscopy Study of CaxBa1−xNb2O6 Single Crystals

Polar structures of CaxBa1-xNb₂O₆ (CBN100x) single crystals were investigated using piezoresponse force microscopy. Increasing Ca content results in decreasing domain size and enhancement of the polar disorder. For the composition with x = 0.32 the characteristic domain size is similar to that reported for relaxor Sr0.61Ba0.39Nb₂O₆ (SBN61). However, decay of an artificial macroscopic domain in ...

Contrast mechanism maps for piezoresponse force microscopy

Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influen...